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Introduction to Scanning Probe Microscopy- spring 2013
Time: Friday 9:00 to 11:45
Location: E115A
Notes from Lecture 1 Introduction to SPM
Notes from Lecture 2; AFM Components, Imaging Software
Notes from Lecture 3: System Optimization
Notes from Lecture 4: Contact Mode
Notes from Lecture 5: Non-Contact Mode
Notes from Lecture 6: Artifacts
Notes from Lecture 7: Scanning Tunneling Microscopy
Notes from Lecture 8: Scanner Calibration
Notes from Lecture 9: Force vs. Distance & Environmental Control & Liquid Cell
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