Silicon Nanowiresafm_wrinkled_pmhsxrd_sputtered_siliconopd_solar_cell

The Materials Characterization and Metrology Center at San José State University provides a wide variety of materials imaging and chemical analysis capabilities for numerous applications throughout science and engineering. The Center serves students, faculty, industry collaborators, and educational outreach partners at SJSU and across Silicon Valley.

Establishment of the Center was made possible by support from the Defense Microelectronics Activity (Cooperative Agreements #H94003-07-2-0705-SJSU and #H94003-08-2-0806-SJSU) and the National Science Foundation (Major Research Instrumentation (MRI) Award #0421562).