Mysore, Ananda V

Lecturer AY-B, Mechanical Engineering




Office Hours

Tue 4:30PM To 5:30 PM or by Appointment

Ananda Mysore has an extensive experience in the concept design, system development & integration and testing of high precision inspection & measurement systems incorporating Machine Vision, Laser and other non-contact and contact measurement technologies. Related areas of expertise include:
  • Cost effective sub-micron metrology system design, development & Mathematical modeling
  • Software development using LabVIEW and IMAQ Vision
  • DFSS & Statistical data analysis
  • X-Y Stage error mapping and Motion System Analysis
  • Laser Interferometer measurements of stage errors
  • Recognized by the professional organizations in the dimensional metrology field


  • Master of Science, Univ Of North Carolina At Char, 1993


  • M.S. (Mechanical Engineering) 1993
    University of North Carolina at Charlotte, NC

  • B.E. (Mechanical Engineering) 1989
    Bangalore University, India

Industrial Experience:

Total of more than 15 years of experience in various companies:

  • Seagate Technology, Scotts Valley, CA
  • KLA-Tencor - Milpitas, CA
  • CyberOptics Corporation, Golden Valley, MN
  • JMAR-PPL,Inc., Chatsworth, CA
  • NIST-US Department of Commerce, Gaithersburg, MD

  • Sapphire Alignment Fixture, Patent No. US 7,421,795, September 9, 2008
  • Sleeve cone angle measurement system, Patent No. US 7,350,308, April 1st , 2008
  • Shaft cone Metrology System & Method, Patent No. US 7,253,889, August 7, 2007
  • System and Method for ECM Land Erosion Metrology, Patent No. US 6,904,790 B2, June 14, 2005
  • Other patents pending

  • Evaluation of High Precision Triangulation Sensors for Coordinate Measurement, ASPE 10th Annual Meeting, 1995
  • Analyzing Measurement Systems: Using Machine Vision for better wire bonds, Advanced Packaging, May/June 1994
  • Residual Error Compensation of a Vision Based Coordinate Measuring Machine, Proc. of the ASPE Annual Meeting,1993

  • Recipient of 2006 Seagate Technology Outstanding Technical Innovation Award
  • Recipient of 1998 ASME B89 Award

Professional Activities:
  • Advisor for SME 2008 & 2009 Nano Manufacturing Conference
  • Member of ANSI/ASME B89 Standard committee