Nanowires
Scanning electron microscope (SEM) image of silicon nanowires grown using a vapor phase transport method (R. Scheffler).
Plasma-wrinkled surfaces
Atomic force microscope (AFM) image of wrinkled polymer surface by oxygen plasma treatment (E. M. Ghandehari, M. Goedert, S. J. Lee).
Sputtered silicon
X-ray diffraction (XRD) spectra from sputtered amorphous silicon film (D. Arpanuthut and E. Allen).
Solar cells
3-D optical profilometer image of solar cell (D. Parent).
The Materials Characterization and Metrology Center at San José State University provides a wide variety of materials imaging and chemical analysis capabilities for numerous applications throughout science and engineering. The Center serves students, faculty, industry collaborators, and educational outreach partners at SJSU and across Silicon Valley.
Establishment of the Center was made possible by support from the Defense Microelectronics Activity (Cooperative Agreements #H94003-07-2-0705-SJSU and #H94003-08-2-0806-SJSU) and the National Science Foundation (Major Research Instrumentation (MRI) Award #0421562).